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Professor
Professor
Jung-wan Cho
  • Dgree
  • Stanford University 공학박사
  • Major
  • 열공학
  • Interest
  • 마이크로/나노 스케일 열전도, 박막의 열물성 측정, 반도체 재료, 반도체 디바이스 열관리, 에너지 변환
  • Tel
  • 031-201-2431
  • Email
  • jungwan.cho@khu.ac.kr
Education
 Ph.D., Stanford University, Department of Mechanical Engineering, U.S.A., 2014.09  M.S., Stanford University, Department of Mechanical Engineering, U.S.A., 2010.06  B.S, Seoul National University, Department of Mechanical Engineering, Korea, 2008.02
Career
 Assistant Professor, Kyung Hee University, Korea, 2016 – present  Postdoctoral Scholar, Stanford University, U.S.A., 2014 – 2016 Development of thermoreflectance thermometry techniques for thermal property measurements of advanced semiconductor thin films and nanostructures, National Research Foundation of Korea, 2016.06-2019.05  Phonon thermal conductivity reduction and ZT enhancement in Bi2Te3 thin films, National Research Foundation of Korea, 2016.12-2017.11  Multicarrier and low-dimensional thermal conduction at interfaces for high power electronic devices, Air Force Office of Scientific Research, USA, 2012.04-2015.03  Device-level thermal management for gallium nitride high electron mobility transistors, Defense Advanced Research Projects Agency, USA, 2010.09-2011.08
Paper
 J. Cho and K. E. Goodson, 2015, "Thermal Transport: Cool Electronics," Nature Materials, 14(2): 136–137.  J. Cho, Y. Li, W. Hoke, D. H. Altman, M. Asheghi, and K. E. Goodson, 2014, "Phonon Scattering in Strained Transition Layers for GaN Heteroepitaxy," Physical Review B, 89(11): 115301.  J. Cho, D. Francis, D. H. Altman, M. Asheghi, and K. E. Goodson, 2017, "Phonon Conduction in GaN-Diamond Composite Substrates," Journal of Applied Physics, 121(5): 055105.
Conference
 Member of American Society of Mechanical Engineers ASME (– Present)  Member of Korean Society of Mechanical Engineers KSME (2016– Present)
Interest
Thermal science, heat transfer, micro- and nanoscale heat conduction, electronics cooling, energy conversion, experimental characterization of thermal properties (ultrafast optical methods)